The most recent rerelease was updated in june 2000, and its wip is to work together with esda on the hpc test methods effects of testing the hpc device on smaller pin count testers 1. Copies of this standard may be purchased from document center inc. Human body jesd22 a114 1 kv charged device jesd22c101 500 v notes. Michael krist, andrew farris, nicolas vickers, student authors dr. Cbz750levx, cba750evx, cba750esp, cba750wsp, arc cba750 series, arc cba750levz, arc cba750evz, arc cba750esp, arc cba750wsp. Mission life critical applications such as military, aerospace and medical applications. Cradlepoint cba750 series user manual pdf download. Jesd22a108 temperature, bias, and operating life 3. To purchase hard copies of jedec standards or for subscription services, please contact one of the following authorized resellers. Tin whisker growth results on tin surface finished. Each channel o ers fteen predetermined output voltages via four control pins programmable from 0. Jesd22a120 provides a method for determining the diffusion coefficient. Mobile and handheld electronic devices are prone to being dropped.
Burstnoyes specifies whether the printed output from the indicated 3800 printer is to be burst into separate sheets y or is to be in continuous fanfold form n. Not all parts subjected to preconditioning were used for subsequent qualification testing. Jedec standard jesd22a108 as well as other industry and customer specific standards can be accommodated. Sn65lvdxx highspeed differential line drivers and receivers. Jesd22a1 preconditioning of nonhermetic surface mount devices prior to reliability testing 3. View and download cradlepoint cba750 series user manual online. The max4800amax4802a provide highvoltage switching on eight channels for ultrasonic imaging and printer applications. Obsolete products obsolete products total power dissipation per package 1 w. The test requires a pressure chamber capable of maintaining a specified temperature and relative humidity continuously, while providing electrical connections to the devices under test in a specified biasing configuration.
Device and subassembly mechanical shock test method is intended to evaluate devices in the free state and assembled to printed wiring boards for use in electrical equipment. Bus pins stressed with respect to gnd and vcc separately. Proper handling in the manufacturing process and storage conditions are required to prevent voltage exceeding the product maximum rating to be applied to the products. Jesd22a108 datasheet, jesd22a108 datasheets, jesd22a108 pdf, jesd22a108 circuit. Jesd22 c101 jeita ed4702 jedec jesd22 a114 human body model. Fan6749 highly integrated ultra greenmode pwm controller. Vdfn30308 ul flammability rating 94v0 case material.
It is specifically designed for highperformance offline switchedmode power supplies smps with minimal external components. Tc74 product qualification report microchip technology. Jedec code jedec jesd22 c101 jeita ed4702 jedec jesd22 a114 human body model. V jesd22 a114 b esd robustness cdm v esd,cdm 500 v jesd22 c101 a storage temperature t store65 125 c high temperature incurs nvm retention time penalty attention. The change to the jesd22a110 c compared to the jesd22a110 b, was the addition of a note in clause 4. Thermal resistance 1, 2 gate resistance of 2000ohm. Drop impact dynamic response study of jedec jesd22. Previous topic next topic contents contact zos library pdf starting a printer defined to jes2 zos jes2 commands sa32099000 once the system has been. The strfnfca manages frame coding and decoding in reader, card emulation and. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Air to air 65c to 165c, 10 min dwell, 1 minute transition, cycles jesd22a104 55, minute transition, cycles jesd22a104 29 pass a2 high temperature operating life. The maximum and minimum parameters values over operating temperature range are not tested in production, they are guaranteed by design, characterization and process control. One lot of tc74 was tested to determine susceptibility to esd. The control pins allow for onthe y voltage changes, enabling system. All voltage values, except differential voltages, are given with respect to the network ground terminal. Avago 3mm yellow gaaspgap led lamps,alldatasheet, datasheet, datasheet search site for electronic components and semiconductors, integrated circuits, diodes, triacs, and other semiconductors.
Jesd22 a114 all pins except hv pin4 6000 v charged device model, jedec. Data for one esd model can not be substituted for those of the other esd models, since good esds test results for one. Once the system has been initialized, you must use the mvs command to vary the printer online. Refer to jedec specification jesd22 a114 and jesd22a115. Esd protection exceeds 2000 v hbm per jesd22 a114 and v cdm per jesd22c101 latchup testing is done to jedec standard jesd78 which exceeds 100 ma three packages offered.
Electrostatic discharge esd sensitivity classification levels. The highlyaccelerated temperature and humidity stress test is performed for the purpose of evaluating the reliability of nonhermetic packaged solidstate devices in humid environments. Esds devices with human body model sensitivities of less than 200 volts may need additional protective measures beyond those specified in this standard. Cradlepoint mbr1400levz product manual pdf download. Jesd22 a114 1 positive discharge and 1 negative discharge per pin for each pin combination 3 deviceslevel 030 150v class 0b 1. Jesd22c101 jeita ed4701 302 jedec jesd22a114 jeita ed4701 302 this product is electrostatic sensitive product, which may be damaged due to electrostatic discharge. Acceptable alternative test conditions and temperature tolerances are a through h, i, l, or m as defined in table 1 of jesd22a104, temperature cycling. Stresses beyond those listed under absolute maximum ratings may cause permanent damage to.
Life jedec jesd22a108 erase write cycles internal high temperature bake electrostatic discharge latchup altera corporation jedec jesd22a103 jedec jesd22 a114 a115. Fan6749 highly integrated ultra greenmode pwm controller absolute maximum ratings stresses exceeding the absolute maximum ratings may damage the device. A complete esd characterization of every new product prior to its release is highly recommended. Drop impact dynamic response study of jedec jesd22b111 test. Complete esd characterization consists of subjecting the device to esd testing for all of the three esd models, i. Jedec standard jesd22 a108 as well as other industry and customer specific standards can be accommodated.
Esd protection exceeds 2000 v hem per jesd22 a114, 200 v mm per jesd22a115, and v cdm per jesd22c101 latchup testing is done to jedec standard jesd78 which exceed 100 ma. Note 2 the standard soak time includes a default value of 24 hours for semiconductor manufacturers exposure time met between bake and bag and includes the maximum time allowed out of the bag at the distributors facility. Device sensitivity to esd is determined by test methods such as jesd22a114. G700lx jedec jesd22a108 g700 sumitomo jesd22a108 jesd a114 100pf jesd22 a114 jesd78 sumitomo g700lx text. This test method establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined electrostatic human body model hbm discharge esd. Printer, facsimile, and scanner adapter for camcorder description the highly integrated fsbhseries consists of an integrated currentmode pulse width modulator pwm and an avalancherugged 700v sensefet. Since the industry is moving towards low profilelow geometry device packages, additional efforts are required to gather more failure data at low temperatures. Data for one esd model can not be substituted for those of the other esd models, since good esds test results for one model doesnt.
Arc mbr1400 series integrated business series routers with 3g4g missioncritical broadband router. Electrical tests test name reference standard test conditions units tested units failed esd jesd22a114 2kv human body model 3pin combination 0 jesd22a115 200v machine model 3pin combination 0 jesd22a101 1kv cdm 3 0 latch up avago condition latch up. Subscribe to the jedec standards and documents rss feed to be notified when new documents are uploaded. Esd22a106 testmethod a106a thermal shock from counc cb94 51 summarypage esd22a106 testmethod a106a thermal shock purposethi mine posur posur 1. View and download cradlepoint mbr1400levz product manual online.
Jesd22b103 20g, 202khz 4 mincycle, 4 cyclesaxis, 3 axis 22 0 table 3. Dec 03, 2010 the change to the jesd22a110 c compared to the jesd22a110 b, was the addition of a note in clause 4. Parameters nnnnn the identifier of the local printer 2767 to dynamically add. Two examples of industry standards that define cdm esd testing are jedecs jesd22c101 and esd associations esd stm5. Jesd22a110 highlyaccelerated temperature and humidity stress test 3. The ltol test is becoming a more frequent test now.
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. Pdf jesd22c101fcdm jedec standard fieldinduced chargeddevice model test method for electrostatic dischargewithstand thresholds of microelectronic components jesd22c101f revision of jesd22c101e, december 2009 october 20 jedec solid state technology association notice jedec standards and publications contain material that has been. Three examples of industry standards that define hbm esd testing are jedecsjesd22 a114. Latchup testing is done to jedec standard jesd78 which exceed 100 ma. Description strfnfca 210 doc id 022168 rev 6 1 description the strfnfca is an integrated transceiver ic for contactless applications. Jesd22 a114 electrostatic discharge esd sensitivity testing human body 3. Jesd22a108 pdf, jesd22a108 description, jesd22a108. Esd protection exceeds 2000 v hem per jesd22 a114, 200 v mm per jesd22a115, and v cdm per jesd22c101.
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